20.5 cm. x 27 cm. glass panel shown in the new 45 cm. x 75 cm. SCANNER
DESCRIPTION
The DELCOM Large Panel Scanner System (LPS) is comprised of a
Scanner Table, Software, Electronics and a non-contact Sensor Head. The
Sensor is controlled by a PC and is driven by an x-y motor drive system
that raster scans the entire planar surface of conductive panels as
large as approx. 18 by 30 inches. The thickness of the glass or plastic
substrate material is not application critical because the tester uses
the newly developed Single-Sided Sensor to read the conductance value
found at each individual location.
CHARACTERISTICS
The LPS is designed primarily for detection of surface defects of
thin film coatings rather than precise determination of sheet
conductance. It is also a non-contact tester, however, it is not
intended to compete with the virtues or advantages of the double-sided,
or caliper type, sensors used in the DELCOM 700 Series Models. As
always, the 700 Series DELCOM Conductance Monitors provide the highest
obtainable absolute accuracy. Regardless, the LPS can read sheet
conductance and is extremely
useful for the determination of defects and relative sheet conductance
over the entire surface of a given surface or panel.
USES
The LPS can find scratches in a conductive coating; furthermore, it
will show whether or not the panel is uniformly coated. Possible
applications of the LPS System include Touch Screens, LCD Displays,
Flat Panel Displays, Flex-Circuitry, and Notebook Computer Screens.
SCREENSHOTS
Following is data showing a glass panel that has an area where the
coating has been intentionally abraded and damaged, thus producing low
value readings. Also shown are zones produced by scratches of various
lengths. The operator’s
main computer screen, at the left below, shows initial results as a red
and green representation, with the red areas corresponding to lower
conductance values.
The screen at the above right shows pinpoint data refinement produced with the use of post-scan data analysis. Through a complex algorithm, the computer program processes embedded data to produce a six-fold sharper image. The resulting matrix is shown in the above black and red screen representation. With a sampling density of approximately forty samples per square inch, the 8 x 11-inch panel is scanned in about 80 seconds. The resulting defect resolution allows for detection of 3mm scratches.
Below is a frequency
distribution showing the bulk
of the readings at the field value of approximately 2.5 millimhos. The
isometric view, at right, shows the major conductance depression at the
lower left of the panel along with the scratches displayed in the right
half.
Please call DELCOM INSTRUMENTS for detailed specifications: 715-262-4466
Or, email us at: mail@delcom-inst.com (Note: Product description is preliminary)